Please be advised that our previous email address, ***@iridian.ca, is no longer in use. Should you need to contact a specific individual at Iridian and are unaware of their updated email address, kindly reach out to us at istsales1@idexcorp.com for assistance.
Iridian will be visiting Laser World of Photonics 2025 on June 24-27 in The Trade Fair Center Messe München in Germany.
If you would like to have a meeting with us at the venue, please contact Daniel Ulba (dulba@idexcorp.com) directly or send a message through our website.
Iridian has a wealth of experience in designing and manufacturing optical filters for both long-distance signal transportation (telecom filters) and for short-range data center interconnects (datacom filters).
We are planning for new events and will publish them shortly, please check back later.
Iridian provides cost effective, advanced optical technology to enable optical Earth Observation (EO) and Remote Sensing for the purpose of wildfire detection, tracking, and management. Contact us for a customized solution to fit your needs.
Iridian will be visiting OFC 2025 on April 1-3 at the Moscone Center in San Francisco, California, USA. We look forward to seeing you there! Click for more details.
Iridian will be visiting APE2025 (Asia Photonics Expo – APE 2025) on February 26-28 in Marina Bay Sands Singapore.
If you would like to have a meeting with us at the venue, please contact Yongbao Xin directly at yxin@idexcorp.com or send a message through our website. We look forward to seeing you there!
Jason Palidwar from Iridian Spectral Technologies discusses optical solutions with a focus on the future of controlled light.
Iridian will be exhibiting at the 2025 SPIE BiOS Expo at the Moscone Center in San Francisco between January 25-26. (Booth#: 8539)
Iridian will be exhibiting at Photonics West Conference at the Moscone Center in San Francisco between Jan 28-30. Please visit Us at Booth # 949.
Channel skip filters are components added to wavelength division multiplexing (WDM) add/drop modules — in both coarse wavelength division multiplexing (CWDM) and dense wavelength division multiplexing (DWDM) applications — to facilitate band splitting and to manage multiple ITU channels.
These filters feature narrow transitions from pass band to blocking band, minimizing lost channels while maintaining high spectral efficiency (i.e., limiting insertion loss) since the express channels undergo only one reflection.
The wavefront error (WE) of a surface with an optical coating (“filter”) is ideally measured at the in-band wavelength of the filter. However, quite often this is not possible, requiring that the filter be measured at an out-of-band wavelength (typically 633 nm), assuming that the filter transmits (for transmitted WE, or TWE) or reflects (for reflected WE, or RWE) at this wavelength. This out-of-band TWE/RWE is generally assumed to provide a good estimation of the desired in-band TWE/RWE. It will be shown in this paper that this is not the case for a large class of filters (i.e., bandpass) where the group delay is significantly different at the in-band and out-of-band wavelengths and where the optical filter exhibits a thickness non-uniformity across the surface.
